News and Events

Summer Party 2026

A warm summer evening, great food and plenty of familiar faces: At our 2026 Summer Party, employees, their families and retired colleagues came together once again. It was a relaxed evening filled with good company, and we also had the pleasure of celebrating a very special milestone.

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Our second Klimawin report is here!

Sustainability grows with every decision, every initiative and every step we take. Our second Klimawin report highlights what we have achieved so far, what we are currently working on and why transparency matters just as much as progress.

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The world meets in Staufen.

Strong partnerships are built through personal exchange. That's why we regularly bring our international sales partners together in Staufen. Our International Sales Meeting is an opportunity to share experiences from different markets, introduce new developments and learn from one another – helping us better understand our customers and their

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Upcoming Events

Dutch Photonics Event

September 23 – 24, 2026
Brabanthallen - Den Bosch - Netherlands

Represented by:
Te Lintelo Systems BV

W3+ Fair Jena

September 23 – 24, 2026
Sparkassen-Arena
Jena (Germany)

Represented by: 
OWIS

Photonic Days Berlin Brandenburg

October 07 - 08, 2026
Bunsen-Saal WISTA-Veranstaltungszentrum Berlin (Germany)

Represented by: 
OWIS

2026 Motion Control Show

October 14 - 16, 2026
Seoul, Coex, hall c&d - Korea

Represented by:
Limotion Systems

Precision Fair

November 18 -19, 2026
Brabant hall in Hertogenbosch - Netherlands

Represented by:
Te Lintelo Systems BV

Application Reports

OWIS positioning systems in digital-holographic 3D measurement technology

The digital-holographic 3D measurement technology enables fast and at the same time highly precise measurement of the workpiece surface. To position the workpieces, Fraunhofer Institute for Physical Measurement Techniques IPM uses two LINPOS linear stages with direct drive.

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Large area 3D surface inspection with white light interferometry

For the Gesellschaft für Bild- und Signalverarbeitung (GBS) mbH, who are active in optical metrology, we have developed a customer-specific gantry system. This system enables a precise and accurate approach of individual measuring points as well as scanning of the entire surface in a working space of 1,250 mm x 550 mm x 45 mm.

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Setup for the determination of atomic distances

At the TU Berlin, Prof. Dr. Birgit Kanngiesser‘s “Analytical X-ray Physics“ group succeeded in developing a method that efficiently uses the light of an X-ray tube and directs it to a detector with little loss of brilliance. This allows measurements for the determination of atomic distances to be carried out even in smaller Caboratories. OWIS positioning systems simplify the handling decisively.

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Solid phase fluoro spectrometer

The fluorescence spectroscopy uses fluorescence phenomena for the analysis of substances. It differs from several other spectroscopies as it measures the emission instead of the absorption of fluorescent radiation. The research institute „wfk – Cleaning Technology Institute e.V.“ in Krefeld, Germany, for example examines dirt on fabric surfaces in order to identify fluorescent-marked bacteria. This procedure is used for the evaluation of a successful hygiene of a washing process.

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Line laser alignment

A perfectly aligned line laser shall project a homogeneous line. The laser manufacturers are facing various challenges such as straightness of the line, a homogeneous distribution of intensity as well as the orientation of the line in regards to the housing. In order to achieve the goal of a homogeneous line, an anamorphic refractive optic needs to be aligned precisely to a collimated beam of a laser module.

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The FXE instrument

Femtosecond spectroscopy with X-rays is one of the tasks of the European XFEL, the 3.4 km long X-ray laser located in the Hamburg area. The FXE Group (Femtosecond X-Ray Experiments) carries out time-resolved studies on the dynamics of solid objects, fluids and gases. For this purpose, an X-ray emissions spectrometer was installed, which combines 16 single diffraction crystals.

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Measurement of samples

In our example from metrology and analytics, hundreds of samples shall be analysed as fast as possible. In this application, not the lateral traverse speed but the process time is the main cost factor. Due to the sum of the vertical tolerances of all components, an individual refocusing of the camera is required. In order to avoid this time-consuming refocusing, our positioning units are being manufactured, assembled and measured for maximum flatness. Due to this high precision of only a few micrometres, in many applications the refocusing can be dispensed completely.

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