News and Events

Dr. Dominik Zimmermann becomes authorized signatory and Chief Business Development Officer (CBDO)

With effect from February 1, 2024, Dr. Dominik Zimmermann has been granted power of attorney and appointed Chief Business Development Officer (CBDO). In his new role, Zimmermann will continue to be responsible for the OWIS Engineering division and, together with the OWIS management team led by Managing Director Rüdiger Ruh, will drive the company's further development.

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The new generation of positioning stages with direct drive is now available. (copy 1)

We have added a new generation of linear and rotary stages with direct drive to our range of motorized positioners. The three new products LINPOS S, LINPOS M and ROTPOS combine six advantages. Get to know the new generation and discover the benefits.

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Summer party 2023

Under the motto "shining together", our employees and their families enjoyed an evening full of joy, fun and fellowship. With food and drink we had a great time together under the warm rays of the sun.

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Upcoming Events

SIAMS Moutier

Trade fair for microtechnology

April 16 - 19, 2024
Moutier - Switzerland

Represented by:
teltec systems ag


April 24,   2024
Girls' Day at OWIS


Juni 11 – 14, 2024
Palexpo, Geneva - Switzerland

Represented by:
teltec systems ag


National Optics Conference

July 03 – 05, 2024
University of Murcia - Spain

Represented by:
Pro-Lite Technology Iberia S.L.

SRI 2024 Hamburg

March 27 - 29, 2024
CCH / Hamburg (Germany)


Swiss Physical Society

September  9 - 13, 2024
ETH Zürich - Switzerland

Represented by:
teltec systems ag

W3+ Fair Jena

September 25 - 26, 2024
Sparkassen-Arena Jena

Booth C11b

Application Reports

Large area 3D surface inspection with white light interferometry

For the Gesellschaft für Bild- und Signalverarbeitung (GBS) mbH, who are active in optical metrology, we have developed a customer-specific gantry system. This system enables a precise and accurate approach of individual measuring points as well as scanning of the entire surface in a working space of 1,250 mm x 550 mm x 45 mm.

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Setup for the determination of atomic distances

At the TU Berlin, Prof. Dr. Birgit Kanngiesser‘s “Analytical X-ray Physics“ group succeeded in developing a method that efficiently uses the light of an X-ray tube and directs it to a detector with little loss of brilliance. This allows measurements for the determination of atomic distances to be carried out even in smaller Caboratories. OWIS positioning systems simplify the handling decisively.

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Solid phase fluoro spectrometer

The fluorescence spectroscopy uses fluorescence phenomena for the analysis of substances. It differs from several other spectroscopies as it measures the emission instead of the absorption of fluorescent radiation. The research institute „wfk – Cleaning Technology Institute e.V.“ in Krefeld, Germany, for example examines dirt on fabric surfaces in order to identify fluorescent-marked bacteria. This procedure is used for the evaluation of a successful hygiene of a washing process.

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Line laser alignment

A perfectly aligned line laser shall project a homogeneous line. The laser manufacturers are facing various challenges such as straightness of the line, a homogeneous distribution of intensity as well as the orientation of the line in regards to the housing. In order to achieve the goal of a homogeneous line, an anamorphic refractive optic needs to be aligned precisely to a collimated beam of a laser module.

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The FXE instrument

Femtosecond spectroscopy with X-rays is one of the tasks of the European XFEL, the 3.4 km long X-ray laser located in the Hamburg area. The FXE Group (Femtosecond X-Ray Experiments) carries out time-resolved studies on the dynamics of solid objects, fluids and gases. For this purpose, an X-ray emissions spectrometer was installed, which combines 16 single diffraction crystals.

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Measurement of samples

In our example from metrology and analytics, hundreds of samples shall be analysed as fast as possible. In this application, not the lateral traverse speed but the process time is the main cost factor. Due to the sum of the vertical tolerances of all components, an individual refocusing of the camera is required. In order to avoid this time-consuming refocusing, our positioning units are being manufactured, assembled and measured for maximum flatness. Due to this high precision of only a few micrometres, in many applications the refocusing can be dispensed completely.

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