OWIS with new owner
OWIS with new owner: The present managing director and shareholder Ruediger Ruh takes over the company with effect from January 1, 2021. With this takeover, OWIS gains a strategy focusing on the future.
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Application Reports
OWIS positioning systems in digital-holographic 3D measurement technology
The digital-holographic 3D measurement technology enables fast and at the same time highly precise measurement of the workpiece surface. To position the workpieces, Fraunhofer Institute for Physical Measurement Techniques IPM uses two LINPOS linear stages with direct drive.
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Large area 3D surface inspection with white light interferometry
For the Gesellschaft für Bild- und Signalverarbeitung (GBS) mbH, who are active in optical metrology, we have developed a customer-specific gantry system. This system enables a precise and accurate approach of individual measuring points as well as scanning of the entire surface in a working space of 1,250 mm x 550 mm x 45 mm.
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Setup for the determination of atomic distances
At the TU Berlin, Prof. Dr. Birgit Kanngiesser‘s “Analytical X-ray Physics“ group succeeded in developing a method that efficiently uses the light of an X-ray tube and directs it to a detector with little loss of brilliance. This allows measurements for the determination of atomic distances to be carried out even in smaller Caboratories. OWIS positioning systems simplify the handling decisively.
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Solid phase fluoro spectrometer
The fluorescence spectroscopy uses fluorescence phenomena for the analysis of substances. It differs from several other spectroscopies as it measures the emission instead of the absorption of fluorescent radiation. The research institute „wfk – Cleaning Technology Institute e.V.“ in Krefeld, Germany, for example examines dirt on fabric surfaces in order to identify fluorescent-marked bacteria. This procedure is used for the evaluation of a successful hygiene of a washing process.
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Line laser alignment
A perfectly aligned line laser shall project a homogeneous line. The laser manufacturers are facing various challenges such as straightness of the line, a homogeneous distribution of intensity as well as the orientation of the line in regards to the housing. In order to achieve the goal of a homogeneous line, an anamorphic refractive optic needs to be aligned precisely to a collimated beam of a laser module.
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The FXE instrument
Femtosecond spectroscopy with X-rays is one of the tasks of the European XFEL, the 3.4 km long X-ray laser located in the Hamburg area. The FXE Group (Femtosecond X-Ray Experiments) carries out time-resolved studies on the dynamics of solid objects, fluids and gases. For this purpose, an X-ray emissions spectrometer was installed, which combines 16 single diffraction crystals.
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Measurement of samples
In our example from metrology and analytics, hundreds of samples shall be analysed as fast as possible. In this application, not the lateral traverse speed but the process time is the main cost factor. Due to the sum of the vertical tolerances of all components, an individual refocusing of the camera is required. In order to avoid this time-consuming refocusing, our positioning units are being manufactured, assembled and measured for maximum flatness. Due to this high precision of only a few micrometres, in many applications the refocusing can be dispensed completely.
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